Blackwell: Test Diagnosis advance to navigation | advance to content

Blackwell Book Services

Collection Manager: Log In | Sign Up

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach

[photo: Book Jacket]

Edited by Yichuang Sun

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits and systems in a single source. The book contains eleven chapters written by leading researchers world-wide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and text issues are also addressed from the SoC perspective. A must-have reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.


PB 9780863417450
£50.00

May 2008
Institution of Engineering and Technology
IET Circuits, Devices and Systems Series

Blackwell Recommends

Check out our monthly features of new and forthcoming titles in popular subject areas. This month’s topic is Environmental Studies & Sustainability.

Special Offers

Check out our great promotions.

News Subscriptions

Keep up-to-date on electronic resources, new titles, developing services and great savings by signing up for our news subscriptions.